Iliad 300

Integrated EELS & Dual-X or Super-X EDX; NanoPulser beam blanker; For advanced materials analysis

• Status: Active
• Country: USA
• Electron gun type : Cold FEG
• Standard detectors : Zebra EELS, Super-X or Dual-X EDX
• Optional detectors : EBSD, EFTEM optional
• STEM : Yes
• STEM parameters: Probe corrected; Multimodal EELS/EDX; up to 5 MultiEELS windows
• Additional analytical capabilities (EDS/EDX ; EELS; SAED;NBD; others) : EDX (Super-X / Dual-X), EELS (MultiEELS), AutoScript, Velox
• Electron optics : Cold FEG (X-CFEG), integrated EELS spectrometer, NanoPulser beam blanker
• Resolution : 50 pm STEM resolution; 0.025 eV EELS resolution (UHR pkg)
• Optical column : S-TWIN lens; chromatic defocus correction optics
• Electron beam resolution : STEM: 50 pm (probe corrected); Info limit: 70 pm (UHR)
• Beam current : - (probe currents listed per resolution only)
• Accelerating voltage : 30 – 300 kV
• Image parameters : EELS rate: up to 10,000 spectra/s
• Holder Types : Compatible with broad range of holders
• Aberration Correction type : Probe corrected STEM (HR/UHR)