Specifications

  • Category: Electron Microscopy
  • Technique: Transmission Electron Microscopy
  • Manufacturer: Thermo Fisher Scientific
  • Country: USA
  • Available: Active
All specifications

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Short description

Fully integrated EELS/EDX STEM; Ultra-X detector and Zebra EELS; 30–300 kV voltage with live switching

Specifications

Fully integrated EELS/EDX STEM; Ultra-X detector and Zebra EELS; 30–300 kV voltage with live switching

  • Status: Active
  • Country: USA
  • Electron gun type : Cold FEG
  • Standard detectors : Zebra EELS, Ultra-X EDX
  • Optional detectors : EBSD, EFTEM optional
  • STEM : Yes
  • STEM parameters: Probe corrected; Multimodal EELS/EDX; up to 5 MultiEELS windows
  • Additional analytical capabilities (EDS/EDX ; EELS; SAED;NBD; others) : EDX (Ultra-X), EELS (MultiEELS), AutoScript, Velox
  • Electron optics : Cold FEG (X-CFEG), integrated EELS spectrometer, high-stability optics
  • Resolution : 50 pm STEM resolution; 0.025 eV EELS resolution (UHR pkg)
  • Optical column : S-TWIN lens; chromatic defocus correction optics
  • Electron beam resolution : STEM: 50 pm (probe corrected); Info limit: 70 pm (UHR)
  • Beam current : - (probe currents listed per resolution only)
  • Accelerating voltage : 30 – 300 kV (live switching)
  • Image parameters : EELS rate: up to 10,000 spectra/s
  • Holder Types : Compatible with broad range of holders
  • Aberration Correction type : Probe corrected STEM (HR/UHR)

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