Specifications

  • Category: Electron Microscopy
  • Technique: Transmission Electron Microscopy
  • Manufacturer: JEOL
  • Country: Japan
  • Available: Active
All specifications

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Short description

Cryo-electron microscope equipped with Cold FEG and automated cryo-transfer system. In-column Omega filter enables high contrast, energy-filtered imaging. Supports 12-specimen storage with automated exchange and SPA workflow.

Specifications

Cryo-electron microscope equipped with Cold FEG and automated cryo-transfer system. In-column Omega filter enables high contrast, energy-filtered imaging. Supports 12-specimen storage with automated exchange and SPA workflow.

  • Status: Active
  • Country: Japan
  • Electron gun type : Cold FEG
  • Optional detectors : Bright-field STEM detector; Dark-field STEM detector; Hole-free phase plate
  • Cryo : Yes
  • STEM : Optional
  • STEM parameters: Bright-field and dark-field STEM detectors
  • Additional analytical capabilities (EDS/EDX ; EELS; SAED;NBD; others) : SPA, MicroED, energy loss spectra, energy-filtered imaging
  • Electron optics : Cold FEG with in-column Omega energy filter
  • Resolution : Enables high-resolution bio-macromolecule imaging
  • Optical column : In-column Omega energy filter
  • Accelerating voltage : 200 kV (optional: 100 kV)
  • Chamber : Automated cryo-transfer system with air-lock; 4-cartridge exchange; storage for 12
  • Camera details : Direct detection camera (optional); bottom-mount for auto alignment
  • Stage parameters : X/Y: ±1 mm motor, ±0.5 µm piezo; Z: ±0.2 mm; Tilt-X: ±70°; Rotation: 0° or 90°
  • Holder Types : Cartridge-based cryo holders; 4-changeable, 12 storable
  • Cooling system : Liquid nitrogen with automated fill system
  • Power Requirements and Consumption : Single phase, 200 V AC, 8 kVA
  • Environmental requirements : Temp: 15–25°C (±0.2°C/h); RH ≤60%
  • Dimensions and Weight: Microscope room: 6000×5000 mm; Utility room: 6000×2500 mm; Ceiling: ≥3200 mm

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Other company product

JSM-IT810

  • Category: Electron Microscopy
  • Technique: Scanning Electron Microscopy
  • Manufacturer: JEOL
  • Country: Japan
  • Available: Active
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