Specifications

  • Category: Electron Microscopy
  • Technique: Transmission Electron Microscopy
  • Manufacturer: Hitachi High-Tech
  • Country: Japan
  • Available: Active
All specifications

About

Short description

TEM for biological and industrial materials. Wide field observation at low magnifications. High-contrast imaging of biological ultra-thin sections

Specifications

TEM for biological and industrial materials. Wide field observation at low magnifications. High-contrast imaging of biological ultra-thin sections

  • Status: Active
  • Country: Japan
  • Electron gun type : LaB₆ Thermionic source
  • Standard detectors : High-sensitivity CMOS camera (VELETA, Rio9, etc.)
  • Optional detectors : EDX (EDAX, Bruker), CCD/CMOS cameras, STEM detector
  • Cryo : Optional
  • STEM : Optional
  • STEM parameters: STEM detector optional
  • Additional analytical capabilities (EDS/EDX ; EELS; SAED;NBD; others) : EDX, STEM, tomography, low-dose imaging
  • Resolution : 0.38 nm (lattice image)
  • Electron beam resolution : 0.38 nm
  • Accelerating voltage : 20–120 kV
  • Image parameters : TEM, SE, STEM, EDX, wide field observation
  • Magnification : ×20 to ×600,000 (photo magnification), ×25 to ×800,000 (display)
  • Chamber : Specimen up to 3 mm dia. standard
  • Camera details : CMOS camera options: Rio9, VELETA, TEMCAM, etc.
  • Stage parameters : Motorized stage with 5-axis control
  • Holder Types : Single-tilt, double-tilt, high tilt, rotation, heating, cooling, cryo holders
  • Sample size: 3 mm diameter (standard)
  • Cooling system : Optional cooling stage available
  • Vacuum system : Dry scroll and turbo pumps
  • Power Requirements and Consumption : AC100 V ±10%, 1 kVA or less
  • Environmental requirements : 20–25 °C, 50% RH or less
  • Dimensions and Weight: Main unit: 900×1300×1600 mm, approx. 650 kg

Articles

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ZA3700

  • Category: Spectroscopy
  • Technique: Atomic Absorption Spectroscopy
  • Manufacturer: Hitachi High-Tech
  • Country: Japan
  • Available: Active
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