JEM-ACE200F

Atomic resolution analytical microscope with double Wien-filter monochromator. Achieves ultra-high energy resolution for EELS. Enables monochromatic STEM imaging and mapping of phonon and plasmon signals.

• Status: Active
• Country: Japan
• Electron gun type : Schottky FEG
• STEM : Yes
• STEM parameters: HAADF-STEM with 1 nm probe; STEM unaffected by monochromator slit size
• Additional analytical capabilities (EDS/EDX ; EELS; SAED;NBD; others) : Monochromatic EELS, phonon/vibrational spectroscopy, plasmon mapping
• Electron optics : Double Wien-filter monochromator, Schottky source, post-accelerator design
• Resolution : 14 meV at 30 kV; 24–260 meV at 60/200 kV depending on slit width
• Optical column : Double Wien-filter “Spot-IN and Spot-OUT system”
• Electron beam resolution : 14 meV energy resolution at 30 kV; 30 meV at 200 kV
• Beam current : 75 pA for plasmon mapping; 10 pA for phonon EELS
• Accelerating voltage : 60 kV and 200 kV tested; designed for 30–200 kV range
• Aberration Correction type : Achromatic and stigmatic exit beam after monochromator
• Environmental requirements : Room isolation from pumps and power; low acoustic/vibration required
• Vibration, Magnetic, Noise tolerance : Microscope room isolated from power, chiller, compressor
• Dimensions and Weight: Microscope room: 5000×5500×3300 mm; Utility: 5000×2200×2000 mm