J-Series III

High-resolution SIMS instrument with low-damage ion sources, exceptional depth profiling, and modular adaptability for various applications.

• Status: Active
• Country: UK
• Isotopic: Yes
• Elemental: Yes
• Type of measurable elements: Most of elements, isotopes, and molecular species
• Measurable isotopes/elements: Isotopes of light to heavy elements, molecular species like lipids and proteins
• Analyzer type : Time-of-Flight MS
• Ion source type: Gas Cluster Ion Beam (GCIB), C60 Ion Beam, and ECR Plasma Ion Gun
• Inlet types: Cryo-compatible sample handling with glovebox integration
• High Resolution : Yes
• Sensitivity : Superior sensitivity for low-abundance analytes with a 500x improvement for water sources
• Detection limits : Sub-ppm levels for trace elements and organics
• Detector type : Buncher ToF detector with tandem MS capability
• Primary beam : GCIB (70 kV), C60, ECR Plasma (Xe, O2, He)
• Voltage : Up to 70 kV
• Spatial resolution : Down to 1.5 μm
• Depth profile : Sub-10 nm depth resolution
• Beam energy : Up to 70 keV for GCIB
• Camera : High-resolution optical imaging for sample navigation
• Geometry type : Tandem MS with buncher ToF
• Focusing type : Electrostatic focusing
• Cooling system : Liquid nitrogen cooling for extended cryogenic workflows
• Vacuum system : Ultra-high vacuum system with cryo-compatible pumping
• Gas supply: Argon, oxygen, xenon, helium