Specifications

  • Category: Inorganic and Isotopic Mass Spectrometry
  • Technique: Secondary Ion Mass Spectrometry
  • Manufacturer: CAMECA
  • Country: France
  • Available: Active
All specifications

About

Short description

Magnetic sector SIMS dedicated to high precision elemental and isotopic analyses of highly radioactive samples.

Specifications

Magnetic sector SIMS dedicated to high precision elemental and isotopic analyses of highly radioactive samples.

  • Status: Active
  • Country: France
  • Isotopic: Yes
  • Elemental: Yes
  • Type of measurable elements: Most of elements, isotopes, and molecular species
  • Measurable isotopes/elements: Isotopes of H, C, O, S, REE, and more
  • Analyzer type : Magnetic Sector MS
  • Ion source type: Duoplasmatron source and Cesium ion source for primary beam generation
  • Inlet types: Automated sample stage with ultra-high vacuum sample handling
  • Mass range : 1 to 360 amu
  • High Resolution : Yes
  • Mass resolution/ Mass resolving power : > 20 000 (10% definition, FWTM)
  • Multicollector : Yes
  • Collectors qty : One Electron Multiplier (EM) - Two Faraday Cups (FCs)
  • Abundance sensitivity : < 5 x 10-9 at M±1 (M=28Si)
  • Precision : < 0.2% in EM/EM mode; < 0.2% in FC/FC mode
  • Detector type : one Electron Multiplier (EM) and two Faraday Cups (FCs)
  • Depth profile : < 10e14 atom/cm3
  • Geometry type : Double-focusing magnetic sector geometry
  • Focusing type : Electrostatic and magnetic focusing for ion beams
  • Vacuum system : Ultra-high vacuum system with turbo-molecular pumps
  • Gas supply: High-purity oxygen and cesium for primary beam generation

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KLEORA

  • Category: Inorganic and Isotopic Mass Spectrometry
  • Technique: Secondary Ion Mass Spectrometry
  • Manufacturer: CAMECA
  • Country: France
  • Available: Active
Detailed