KLEORA

High-throughput Secondary Ion Mass Spectrometer (SIMS) for geochronology. Provides benchmark precision for U-Pb and U-Th isotopic analyses. Combines high spatial resolution and mass resolving power in a compact design.

• Status: Active
• Country: France
• Isotopic: Yes
• Elemental: Yes
• Type of measurable elements: Most of elements, isotopes, and molecular species
• Measurable isotopes/elements: U, Th, Pb isotopes
• Analyzer type : Magnetic Sector MS
• Ion source type: RF plasma oxygen ion source (O2−)
• Inlet types: Automated sample storage with motorized adjustment
• High Resolution : Yes
• Mass resolution/ Mass resolving power : Up to 20,000 (10% peak valley definition)
• Sensitivity : Enhanced with oxygen flooding, up to 7x improvement for Pb isotopes
• Detection limits : Sub-ppm for trace elements
• Precision : <0.3%for U-Pb age dating in zircon standards
• Detector type : Faraday Cup and Electron multiplier
• Primary beam : Oxygen (O2−)
• Spatial resolution : Sub-micron lateral resolution (<10 μm)
• Camera : High-resolution UV-light microscope for sample visualization
• Geometry type : Double-focusing large geometry
• Focusing type : Magnetic and electrostatic focusing
• Vacuum system : Ultra-high vacuum system
• Gas supply: High-purity oxygen for ion source and flooding