IMS 7f-GEO

Compact SIMS instrument for geoscience applications. Optimized for both isotopic and elemental in situ microanalysis of geological samples.

• Status: Active
• Country: France
• Isotopic: Yes
• Elemental: Yes
• Type of measurable elements: Most of elements, isotopes, and molecular species
• Measurable isotopes/elements: Isotopes of H, C, O, S, REE, and more
• Analyzer type : Magnetic Sector MS
• Ion source type: Duoplasmatron source and Cesium ion source for primary beam generation
• Inlet types: Automated sample stage with ultra-high vacuum sample handling
• Mass range : 1 to 360 amu at 5 kV sample HV
• High Resolution : Yes
• Mass resolution/ Mass resolving power : Up to 25,000 (10% peak valley definition)
• Abundance sensitivity : < 5 x 10-9 at M±1 (M=28Si)
• Detection limits : Sub-ppm levels for trace elements
• Precision : Sub-permil precision for isotope ratio measurements
• Detector type : one double Faraday cup detector system and one Electron Multiplier
• Possible amplifiers : 2 different resistor types are available for each FC (e.g. 10¹⁰ Ω for 16O and 10¹¹ Ω for 18O)
• Primary beam : Cesium (Cs+) and oxygen (O−)
• Voltage : Up to ±10 kV
• Spatial resolution : Sub-micron resolution for spot analysis
• Beam energy : Up to 10 keV for primary ions
• Camera : High-resolution camera for sample observation
• Geometry type : Large Double-focusing magnetic sector geometry
• Focusing type : Electrostatic and magnetic focusing for ion beams
• Vacuum system : Ultra-high vacuum system with turbo-molecular pumps
• Gas supply: High-purity oxygen and cesium for primary beam generation